Microstructure of strained La2CuO4+delta thin films on varied sub-strates

Simple item page
dc.creatorHe, Jiaqing
dc.creatorKlie, Robert F.
dc.creatorLogvenov, Gennady
dc.creatorBozovic, Ivan
dc.creatorZhu, Yimei
dc.date2006-12-05
dc.date.accessioned2026-07-07T07:31:34Z
dc.date.available2026-07-07T07:31:34Z
dc.descriptionLayered perovskite La2CuO4+delta(LCO) thin films were epitaxially grown on SrTiO3 (STO) and LaSrAlO4 (LSAO) substrates by atomic-layer-by-layer molecular beam epitaxy. The lattice de-fects and residual strain in these films were investigated by means of transmission electron mi-croscopy and electron energy loss spectroscopy. The LCO films showed a high epitaxial quality with flat interfaces and top surfaces. Misfit dislocations with Burgers vector a<010> and shear defects were frequently observed at or near the film/substrate interfaces and in the films, respec-tively, for all the LCO films. In one LCO film, grown on STO at the highest temperature, 700 oC, was a two layered structure. The top layer was identified as rhombohedral LaCuO2 by electron energy loss spectroscopy combined with electron diffraction. In addition, stacking faults were observed in plane-view micrographs of one LCO film grown on the STO substrate. The residual strains were evaluated from the spacing of misfit dislocations at the film/substrate interface and from the split electron diffraction patterns. Possible mechanisms of strain relaxations are dis-cussed based on the observed defects.
dc.description24 pages, 7 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0612129
dc.identifierhttp://arxiv.org/abs/cond-mat/0612129
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/118800
dc.subjectMaterials Science
dc.titleMicrostructure of strained La2CuO4+delta thin films on varied sub-strates
dc.typetext

Files

Collections

arXiv