Phase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy

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dc.creatorLin, Y. -H.
dc.creatorTerai, K.
dc.creatorWadati, H.
dc.creatorKobayashi, M.
dc.creatorTakizawa, M.
dc.creatorHwang, J. I.
dc.creatorFujimori, A.
dc.creatorNan, C. -W.
dc.creatorLi, J. -F.
dc.creatorFujimori, S. -I.
dc.creatorOkane, T.
dc.creatorSaitoh, Y.
dc.creatorKobayashi, K.
dc.date2007-05-24
dc.date.accessioned2026-07-07T08:09:23Z
dc.date.available2026-07-07T08:09:23Z
dc.descriptionEpitaxial Ba0.5Sr0.5TiO3 thin films were prepared on Nb-doped SrTiO3 (100)substrates by the pulsed laser deposition technique, and were studied by measuring the Ti 2p - 3d resonant photoemission spectra in the valence-band region as a function of film thickness, both at room temperature and low temperature. Our results demonstrated an abrupt variation in the spectral structures between 2.8 nm (~7 monolayers) and 2.0 nm (~5 monolayers) Ba0.5Sr0.5TiO3 films, suggesting that there exists a critical thickness for phase change in the range of 2.0 nm to 2.8 nm. This may be ascribed mainly to the intrinsic size effects.
dc.description13 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0705.3675
dc.identifierhttp://arxiv.org/abs/0705.3675
dc.identifierAppl. Phys. Lett. 90, 222909 (2007)
dc.identifierdoi:10.1063/1.2745249
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/131525
dc.subjectMaterials Science
dc.titlePhase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy
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