Dynamics of Josephson junctions and single-flux-quantum networks with superconductor-insulator-normal metal junction shunts

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dc.creatorZorin, A. B.
dc.creatorTolkacheva, E. M.
dc.creatorKhabipov, M. I.
dc.creatorBuchholz, F. -I.
dc.creatorNiemeyer, J.
dc.date2005-12-23
dc.date.accessioned2026-07-07T06:53:40Z
dc.date.available2026-07-07T06:53:40Z
dc.descriptionWithin the framework of the microscopic model of tunneling, we modelled the behavior of the Josephson junction shunted by the Superconductor-Insulator-Normal metal (SIN) tunnel junction. We found that the electromagnetic impedance of the SIN junction yields both the frequency-dependent damping and dynamic reactance which leads to an increase in the effective capacitance of the circuit. We calculated the dc I-V curves and transient characteristics of these circuits and explained their quantitative differences to the curves obtained within the resistively shunted junction model. The correct operation of the basic single-flux-quanta circuits with such SIN-shunted junctions, i.e. the Josephson transmission line and the toggle flip-flop, have also been modelled.
dc.description8 pages incl. 7 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0512615
dc.identifierhttp://arxiv.org/abs/cond-mat/0512615
dc.identifierPhys. Rev. B 74, 014508 (2006)
dc.identifierdoi:10.1103/PhysRevB.74.014508
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/105665
dc.subjectSuperconductivity
dc.titleDynamics of Josephson junctions and single-flux-quantum networks with superconductor-insulator-normal metal junction shunts
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