Charge transport in l-DNA probed by conducting-AFM, and relationship with its structure

dc.creatorHeim, Thomas
dc.creatorDeresemes, Dominique
dc.creatorVuillaume, Dominique
dc.date2003-10-10
dc.date.accessioned2026-07-07T02:54:08Z
dc.date.available2026-07-07T02:54:08Z
dc.descriptionWe studied the electrical conductivity of DNA samples as function of the number of DNA molecules. We showed that the insulating gap (no current at low voltage) increases from ~1-2 V for bundles and large ropes to ~4-7 V for few DNA molecules. From the distance dependent variation of the current, a unique hopping distance of ~3 nm is calculated (polaron-hopping model) independently of the number of DNA in the sample. The highly resistive behavior of the single DNA is correlated with its flattened conformation on the surface (reduced thickness, ~0.5-1.5 nm, compared to its nominal value, ~2 nm).
dc.identifierhttps://arxiv.org/abs/cond-mat/0310242
dc.identifierhttp://arxiv.org/abs/cond-mat/0310242
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22420
dc.subjectSoft Condensed Matter
dc.subjectMaterials Science
dc.subjectBiomolecules
dc.titleCharge transport in l-DNA probed by conducting-AFM, and relationship with its structure
dc.typetext

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