Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure

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dc.creatorBooth, C. H.
dc.creatorBridges, F.
dc.date2003-06-10
dc.date.accessioned2026-07-07T06:21:34Z
dc.date.available2026-07-07T06:21:34Z
dc.descriptionExtended x-ray absorption fine-structure (EXAFS) data collected in the fluorescence mode are susceptible to an apparent amplitude reduction due to the self-absorption of the fluorescing photon by the sample before it reaches a detector. Previous treatments have made the simplifying assumption that the effect of the EXAFS on the correction term is negligible, and that the samples are in the thick limit. We present a nearly exact treatment that can be applied for any sample thickness or concentration, and retains the EXAFS oscillations in the correction term.
dc.description3 pages, 3 figure (eps), submitted to The 12th International Conference on X-Ray Absorption Fine Structure (XAFS XII)
dc.identifierhttps://arxiv.org/abs/cond-mat/0306252
dc.identifierhttp://arxiv.org/abs/cond-mat/0306252
dc.identifierPhysica Scripta, T115, 202 (2005)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/95638
dc.subjectCondensed Matter
dc.titleImproved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure
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