Multiple-Retrapping Process in High-$T_c$ Intrinsic Josephson Junctions

Simple item page
dc.creatorBae, Myung-Ho
dc.creatorSahu, M.
dc.creatorLee, Hu-Jong
dc.creatorBezryadin, A.
dc.date2008-07-24
dc.date.accessioned2026-07-07T09:52:33Z
dc.date.available2026-07-07T09:52:33Z
dc.descriptionWe report measurements of switching-current distribution (SWCD) from a phase-diffusion branch to a quasiparticle-tunneling branch as a function of temperature in a cuprate-based intrinsic Josephson junction. Contrary to the thermal-activation model, the width of the SWCD increases with decreasing temperature, down to 1.5 K. Based on the multiple-retrapping model, we quantitatively demonstrate that the quality factor of the junction in the phase-diffusion regime determines the observed temperature dependence of the SWCD.
dc.description5 pages, 3 figures, 1 table
dc.identifierhttps://arxiv.org/abs/0807.3798
dc.identifierhttp://arxiv.org/abs/0807.3798
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/165637
dc.subjectSuperconductivity
dc.titleMultiple-Retrapping Process in High-$T_c$ Intrinsic Josephson Junctions
dc.typetext

Files

Collections

arXiv