Depth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy

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dc.creatorSouza-Neto, Narcizo M.
dc.creatorRamos, Aline Y.
dc.creatorTolentino, Helio C. N.
dc.creatorMartins, Alessandro
dc.creatorSantos, Antonio D.
dc.date2009-01-28
dc.date.accessioned2026-07-07T12:35:16Z
dc.date.available2026-07-07T12:35:16Z
dc.descriptionA method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.
dc.description5 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/0901.4542
dc.identifierhttp://arxiv.org/abs/0901.4542
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/217713
dc.subjectMaterials Science
dc.titleDepth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy
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