Realization of the anomalous scattering method in crystallography on the basis of the parametric X-ray radiation

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dc.creatorFeranchuk, I. D.
dc.creatorUlyanenkov, A. P.
dc.date2003-12-12
dc.date.accessioned2026-07-07T02:55:22Z
dc.date.available2026-07-07T02:55:22Z
dc.descriptionSpectra of parametric X-ray radiation (PXR) are considered in the range of anomalous dispersion for one of the atoms in a crystal elementary cell. The PXR spectra are calculated both for the ultra-relativistic and non-relativistic electrons for the specific conditions corresponding to the organic compounds . It is shown that analysis of the RXR angular distribution permits one to realize the method of anomalous scattering for direct measurement of the phases of structure amplitudes without additional isomorphic intrusion of a heavy atom.
dc.description5 pages, 1 figure
dc.identifierhttps://arxiv.org/abs/cond-mat/0312310
dc.identifierhttp://arxiv.org/abs/cond-mat/0312310
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22915
dc.subjectMaterials Science
dc.titleRealization of the anomalous scattering method in crystallography on the basis of the parametric X-ray radiation
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