Atomic Structure of Graphene on SiO2

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dc.creatorIshigami, Masa
dc.creatorChen, J. H.
dc.creatorCullen, W. G.
dc.creatorFuhrer, M. S.
dc.creatorWilliams, E. D.
dc.date2008-11-04
dc.date.accessioned2026-07-07T10:15:27Z
dc.date.available2026-07-07T10:15:27Z
dc.descriptionWe employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e. a graphene sheet supported by an insulating silicon dioxide substrate) for the first time. Atomic resolution STM images reveal the presence of a strong spatially dependent perturbation, which breaks the hexagonal lattice symmetry of the graphitic lattice. Structural corrugations of the graphene sheet partially conform to the underlying silicon oxide substrate. These effects are obscured or modified on graphene devices processed with normal lithographic methods, as they are covered with a layer of photoresist residue. We enable our experiments by a novel cleaning process to produce atomically-clean graphene sheets.
dc.description13 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0811.0587
dc.identifierhttp://arxiv.org/abs/0811.0587
dc.identifierNanoLetters 7, 1643-1648, 2007
dc.identifierdoi:10.1021/nl070613a
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/173181
dc.subjectMaterials Science
dc.titleAtomic Structure of Graphene on SiO2
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