Offsets and polarization at strained AlN/GaN polar interfaces
| dc.creator | Bernardini, Fabio | |
| dc.creator | Fiorentin, Vincenzo | |
| dc.creator | Vanderbilt, David | |
| dc.date | 1996-12-11 | |
| dc.date.accessioned | 2026-07-07T09:11:23Z | |
| dc.date.available | 2026-07-07T09:11:23Z | |
| dc.description | The strain induced by lattice mismatch at the interface is responsible for the different value of the band discontinuities observed recently for the AlN/GaN (AlN on GaN) and the GaN/AlN (GaN on AlN) polar (0001) interface. We present a first-principles calculation of valence band offsets, interface dipoles, strain-induced piezoelectric fields, relaxed geometric structure, and formation energies. Our results confirm the existence of a large forward-backward asymmetry for this interface. | |
| dc.description | 6 pages, 2 figures, MRS style (enclosed), to appear in MRS Proc. 448 | |
| dc.identifier | https://arxiv.org/abs/cond-mat/9612107 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/9612107 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/151659 | |
| dc.subject | Materials Science | |
| dc.title | Offsets and polarization at strained AlN/GaN polar interfaces | |
| dc.type | text |