On the measurement by EDX of diffusion profiles of Ni/Cu assemblies

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dc.creatorArnould, Olivier
dc.creatorHild, François
dc.date2007-12-21
dc.date.accessioned2026-07-07T08:50:49Z
dc.date.available2026-07-07T08:50:49Z
dc.descriptionTo characterise (inter)diffusion in materials, concentration profiles can be measured by EDX. It allows one to determine the chemical composition with a very good accuracy if measurement artefacts are accounted for. Standard phenomena (such as X-ray fluorescence) are usually corrected by commercial software. However, the effect of the pear-shaped volume of X-ray emission on the concentration profiles has to be considered. The paper describes the origin of this artefact, its consequences on measurements and will provide a practical solution (based on signal processing methods) to deconvolute the actual concentration profiles (or the diffusion coefficient) from the raw measurements.
dc.identifierhttps://arxiv.org/abs/0712.3636
dc.identifierhttp://arxiv.org/abs/0712.3636
dc.identifierMicroscopy and Analysis European Edition (2000) 13-15
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/144732
dc.subjectClassical Physics
dc.titleOn the measurement by EDX of diffusion profiles of Ni/Cu assemblies
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