Chirality-Biased Point Defects Dynamics on a Disclination Line in a Nematic Liquid Crystal

Simple item page
dc.creatorZywocinski, Andrzej
dc.creatorPawlak, Katarzyna
dc.creatorHolyst, Robert
dc.creatorOswald, Patrick
dc.date2007-10-24
dc.date.accessioned2026-07-07T08:38:20Z
dc.date.available2026-07-07T08:38:20Z
dc.descriptionChiral additives in the nematic liquid crystal can alter the dynamics of point defects moving on a disclination line. They exert a constant force on defects, leading to the bimodal distribution of distances between them at long times. The evolution of the system of defects in the presence of chiral additives provides a very direct proof of the existence of repulsive forces between the defects at large distances. We find that addition of a sufficient amount of chiral compound removes all point defects from the system. The process is studied in the system of 8CB (4-n-octyl-4 '-cyanobiphenyl) doped with the chiral compound S811 (from Merck Co.) and in the computer simulations.
dc.identifierhttps://arxiv.org/abs/0710.4390
dc.identifierhttp://arxiv.org/abs/0710.4390
dc.identifierThe Journal of Physical Chemistry B 19, 109 (2005) 9712-9718
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/140693
dc.subjectSoft Condensed Matter
dc.titleChirality-Biased Point Defects Dynamics on a Disclination Line in a Nematic Liquid Crystal
dc.typetext

Files

Collections

arXiv