Measuring Magnetostriction with an Atomic Force Microscope: Application to Wires in Ballistic Magnetoresistance
| dc.creator | Papageorgopoulos, A. C. | |
| dc.creator | Wang, H. | |
| dc.creator | Guerrero, C. | |
| dc.creator | Garcia, N. | |
| dc.date | 2003-11-25 | |
| dc.date.accessioned | 2026-07-07T02:54:57Z | |
| dc.date.available | 2026-07-07T02:54:57Z | |
| dc.description | In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral magnetoelastic shape changes take place on the sample surface when a magnetic field is applied. We have, furthermore, used this technique to observe magnetically induced strains as small as 5*10-8, and have measured Ni, permalloy and commercial Cu wires and films, as well as pure Cu and Pt wires, where results are in agreement with other methods of measurement. The applications are, moreover, relevant to studies of ballistic magnetoresistance, where we can draw conclusions involving the effect of the magnetically induced strains on magnetoresistance measured at the same time as magnestostriction. | |
| dc.description | 14 pages 4 figures submitted to APL | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0311567 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0311567 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/22767 | |
| dc.subject | Materials Science | |
| dc.title | Measuring Magnetostriction with an Atomic Force Microscope: Application to Wires in Ballistic Magnetoresistance | |
| dc.type | text |