Optical element for X-ray microscopy

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dc.creatorChadzitaskos, G.
dc.date2008-09-30
dc.date.accessioned2026-07-07T10:06:23Z
dc.date.available2026-07-07T10:06:23Z
dc.descriptionWe present a proposal for a X-ray optical element suitable for X-ray microscopy and other X-ray-based display systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray scattering on a slice of monocrystal. These conditions are fulfilled simultaneously due to a properly machined shape of the monocrystal with a stress at its ends.
dc.description8 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0809.5160
dc.identifierhttp://arxiv.org/abs/0809.5160
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/170309
dc.subjectOptics
dc.titleOptical element for X-ray microscopy
dc.typetext

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