Self-doping effects in epitaxially grown graphene

dc.creatorSiegel, D. A.
dc.creatorZhou, S. Y.
dc.creatorGabaly, F. El
dc.creatorFedorov, A. V.
dc.creatorSchmid, A. K.
dc.creatorLanzara, A.
dc.date2009-01-13
dc.date.accessioned2026-07-07T12:29:27Z
dc.date.available2026-07-07T12:29:27Z
dc.descriptionSelf-doping in graphene has been studied by examining single-layer epitaxially grown graphene samples with differing characteristic lateral terrace widths. Low energy electron microscopy was used to gain real-space information about the graphene surface morphology, which was compared with data obtained by angle-resolved photoemission spectroscopy to study the effect of the monolayer graphene terrace width on the low energy dispersions. By altering the graphene terrace width, we report significant changes in the electronic structure and quasiparticle relaxation time of the material, in addition to a terrace width-dependent doping effect.
dc.descriptionPublished in Applied Physics Letters 93, 243119 (2008)
dc.identifierhttps://arxiv.org/abs/0901.1901
dc.identifierhttp://arxiv.org/abs/0901.1901
dc.identifierApplied Physics Letters 93, 243119 (2008)
dc.identifierdoi:10.1063/1.3028015
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/215884
dc.subjectMesoscale and Nanoscale Physics
dc.titleSelf-doping effects in epitaxially grown graphene
dc.typetext

Files

Collections