Microscopic Method for Dislocation Tracking

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dc.creatorPatriarca, M.
dc.creatorRobles, M.
dc.creatorKaski, K.
dc.date2002-12-13
dc.date.accessioned2026-07-07T02:48:43Z
dc.date.available2026-07-07T02:48:43Z
dc.descriptionWe show that a microscopic definition of crystal defect, based on the effective mean single-particle potential energy, makes it possible to detect and visualize various types of local and extended crystal defects and develop an effective algorithm for tracking their time evolution.
dc.description9 pages, 8 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0212318
dc.identifierhttp://arxiv.org/abs/cond-mat/0212318
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/20514
dc.subjectMaterials Science
dc.titleMicroscopic Method for Dislocation Tracking
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