Calibration of shielded microwave probes using bulk dielectrics

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dc.creatorLai, K.
dc.creatorKundhikanjana, W.
dc.creatorKelly, M. A.
dc.creatorShen, Z. X.
dc.date2008-09-24
dc.date.accessioned2026-07-07T10:05:01Z
dc.date.available2026-07-07T10:05:01Z
dc.descriptionA stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from the cantilever body and localizes the interaction only around the focused-ion beam deposited Pt tip. The approaching curve of an oscillating tip toward bulk dielectrics can be quantitatively simulated and fitted to the finite-element analysis result. The peak signal of the approaching curve is a measure of the sample dielectric constant and can be used to study unknown bulk materials.
dc.description10 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/0809.4247
dc.identifierhttp://arxiv.org/abs/0809.4247
dc.identifierAppl. Phys. Lett. 93, 123105 (2008)
dc.identifierdoi:10.1063/1.2990638
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/169892
dc.subjectMaterials Science
dc.titleCalibration of shielded microwave probes using bulk dielectrics
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