Anomalous layering at the liquid Sn surface

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dc.creatorShpyrko, Oleg G.
dc.creatorGrigoriev, Alexei Yu.
dc.creatorPershan, Peter S.
dc.creatorLin, Binhua
dc.creatorMeron, Mati
dc.creatorGraber, Tim
dc.creatorGebhardt, Jeff
dc.creatorOcko, Ben
dc.creatorDeutsch, Moshe
dc.date2004-06-24
dc.date2004-12-15
dc.date.accessioned2026-07-07T02:58:49Z
dc.date.available2026-07-07T02:58:49Z
dc.descriptionX-ray reflectivity measurements on the free surface of liquid Sn are presented. They exhibit the high-angle peak, indicative of surface-induced layering, also found for other pure liquid metals (Hg, Ga and In). However, a low-angle peak, not hitherto observed for any pure liquid metal, is also found, indicating the presence of a high-density surface layer. Fluorescence and resonant reflectivity measurements rule out the assignment of this layer to surface-segregation of impurities. The reflectivity is modelled well by a 10% contraction of the spacing between the first and second atomic surface layers, relative to that of subsequent layers. Possible reasons for this are discussed.
dc.description8 pages, 9 figures; to be submitted to Phys. Rev. B; updated references, expanded discussion
dc.identifierhttps://arxiv.org/abs/cond-mat/0406583
dc.identifierhttp://arxiv.org/abs/cond-mat/0406583
dc.identifierPHYSICAL REVIEW B 70, 224206 (2004)
dc.identifierdoi:10.1103/PhysRevB.70.224206
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24262
dc.subjectStatistical Mechanics
dc.subjectMaterials Science
dc.titleAnomalous layering at the liquid Sn surface
dc.typetext

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