Four-path interference and uncertainty principle in photodetachment microscopy

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dc.creatorKramer, Tobias
dc.creatorBracher, Christian
dc.creatorKleber, Manfred
dc.date2001-06-12
dc.date.accessioned2026-07-07T06:32:19Z
dc.date.available2026-07-07T06:32:19Z
dc.descriptionWe study the quantal motion of electrons emitted by a pointlike monochromatic isotropic source into parallel uniform electric and magnetic fields. The two-path interference pattern in the emerging electron wave due to the electric force is modified by the magnetic lens effect which periodically focuses the beam into narrow filaments along the symmetry axis. There, four classical paths interfere. With increasing electron energy, the current distribution changes from a quantum regime governed by the uncertainty principle, to an intricate spatial pattern that yields to a semiclassical analysis.
dc.descriptionsubmitted to Europhysics Letters
dc.identifierhttps://arxiv.org/abs/quant-ph/0106061
dc.identifierhttp://arxiv.org/abs/quant-ph/0106061
dc.identifierEurophysics Letters, vol. 56 (4), pp. 471-477 (2001)
dc.identifierdoi:10.1209/epl/i2001-00543-x
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/98866
dc.subjectQuantum Physics
dc.titleFour-path interference and uncertainty principle in photodetachment microscopy
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