A model for retention on short, intermediate and long time-scale in ferroelectric thin films
| dc.creator | Lou, X. J. | |
| dc.date | 2008-12-04 | |
| dc.date.accessioned | 2026-07-07T13:12:03Z | |
| dc.date.available | 2026-07-07T13:12:03Z | |
| dc.description | We developed a model with no adjustable parameter for retention loss at short and long time scale in ferroelectric thin-film capacitors. We found that the predictions of this model are in good agreement with the experimental observations in the literature. In particular, it explains why a power-law function shows better fitting than a linear-log relation on a short time scale (10^-7 s to 1 s) and why a stretched exponential relation gives more precise description than a linear-log plot on a long time scale (>100 s), as reported by many researchers in the past. More severe retention losses at higher temperatures and in thinner films have also been correctly predicted by the present theory. | |
| dc.description | 15 pages and 3 figures | |
| dc.identifier | https://arxiv.org/abs/0812.0897 | |
| dc.identifier | http://arxiv.org/abs/0812.0897 | |
| dc.identifier | Journal of Applied Physics 105, 094107 (2009) | |
| dc.identifier | doi:10.1063/1.3106663 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/229473 | |
| dc.subject | Materials Science | |
| dc.title | A model for retention on short, intermediate and long time-scale in ferroelectric thin films | |
| dc.type | text |