Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films

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dc.creatorChan, E. V. R.
dc.date2004-04-16
dc.date.accessioned2026-07-07T02:57:39Z
dc.date.available2026-07-07T02:57:39Z
dc.descriptionData analysis of the CCD files from x ray magnetic resonance scattering linearly polarized in transmission geometry produces information about the radial and azimuthal intensities. In a series of measurements of increasing photon energies trends in data are analyzed.
dc.identifierhttps://arxiv.org/abs/cond-mat/0404371
dc.identifierhttp://arxiv.org/abs/cond-mat/0404371
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23750
dc.subjectOther Condensed Matter
dc.titleLine Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films
dc.typetext

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