Strong magnetic scattering from TiO$_{x}$ adhesion layers

dc.creatorTrionfi, A.
dc.creatorLee, S.
dc.creatorNatelson, D.
dc.date2006-11-26
dc.date.accessioned2026-07-07T07:37:11Z
dc.date.available2026-07-07T07:37:11Z
dc.descriptionElectronic phase coherence in normal metals is incredibly sensitive to magnetic scattering. As a result, the weak localization magnetoresistance and time-dependent universal conductance fluctuations are powerful probes of magnetic impurities. We report measurements of these effects in Au and Ag nanowires with a 1.5 nm thick Ti adhesion layer underneath the deposited metal. The results indicate an anomalously large magnetic impurity concentration due to the Ti layer. Results suggest that this magnetic scattering and its evolution are related to the oxidation state of the Ti.
dc.description3 pages, 3 figures, Appl. Phys. Lett., in press
dc.identifierhttps://arxiv.org/abs/cond-mat/0611633
dc.identifierhttp://arxiv.org/abs/cond-mat/0611633
dc.identifierAppl. Phys. Lett. 89, 262104 (2006)
dc.identifierdoi:10.1063/1.2423327
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/120685
dc.subjectMesoscale and Nanoscale Physics
dc.subjectMaterials Science
dc.titleStrong magnetic scattering from TiO$_{x}$ adhesion layers
dc.typetext

Files

Collections