Distribution of voltage fluctuations in a current-biased conductor

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dc.creatorKindermann, M.
dc.creatorNazarov, Yu. V.
dc.creatorBeenakker, C. W. J.
dc.date2002-10-28
dc.date.accessioned2026-07-07T02:47:56Z
dc.date.available2026-07-07T02:47:56Z
dc.descriptionWe calculate the fluctuating voltage V(t) over a conductor driven out of equilibrium by a current source. This is the dual of the shot noise problem of current fluctuations I(t) in a voltage-biased circuit. In the single-channel case the distribution of the accumulated phase Phi=(e/hbar)\int Vdt is the Pascal (or binomial waiting-time) distribution -- distinct from the binomial distribution of transferred charge Q=\int Idt. The weak-coupling limit of a Poissonian P(Phi) is reached in the limit of a ballistic conductor, while in the tunneling limit P(Phi) has the chi-square form.
dc.description4 pages including 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0210617
dc.identifierhttp://arxiv.org/abs/cond-mat/0210617
dc.identifierPhys.Rev.Lett. 90, 246805 (2003)
dc.identifierdoi:10.1103/PhysRevLett.90.246805
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/20203
dc.subjectMesoscale and Nanoscale Physics
dc.titleDistribution of voltage fluctuations in a current-biased conductor
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