Ground-State Degeneracy of Correlated Insulators with Edges

dc.creatorRefael, Gil
dc.creatorLin, Hsiu-Hau
dc.date2004-09-28
dc.date.accessioned2026-07-07T03:01:05Z
dc.date.available2026-07-07T03:01:05Z
dc.descriptionUsing the topological flux insertion procedure, the ground-state degeneracy of an insulator on a periodic lattice with filling factor $ν=p/q$ was found to be at least $q$-fold. Applying the same argument in a lattice with edges, we show that the degeneracy is modified by the additional edge density $ν_{\mysw{E}}$ associated with the open boundaries. In particular, we demonstrate that these edge corrections may even make an insulator with integer bulk filling degenerate.
dc.description4 pages, REVTeX 4
dc.identifierhttps://arxiv.org/abs/cond-mat/0409729
dc.identifierhttp://arxiv.org/abs/cond-mat/0409729
dc.identifierPhys. Rev. B 72, 073109 (2005)
dc.identifierdoi:10.1103/PhysRevB.72.073109
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24952
dc.subjectStrongly Correlated Electrons
dc.titleGround-State Degeneracy of Correlated Insulators with Edges
dc.typetext

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