Ultrathin oxides: bulk-oxide-like model surfaces or unique films?

dc.creatorFreysoldt, Christoph
dc.creatorRinke, Patrick
dc.creatorScheffler, Matthias
dc.date2007-07-13
dc.date.accessioned2026-07-07T08:24:13Z
dc.date.available2026-07-07T08:24:13Z
dc.descriptionTo better understand the electronic and chemical properties of wide-gap oxide surfaces at the atomic scale, experimental work has focused on epitaxial films on metal substrates. Recent findings show that these films are considerably thinner than previously thought. This raises doubts about the transferability of the results to surface properties of thicker films and bulk crystals. By means of density-functional theory and approximate GW corrections for the electronic spectra we demonstrate for three characteristic wide-gap oxides (silica, alumina, and hafnia) the influence of the substrate and highlight critical differences between the ultrathin films and surfaces of bulk materials. Our results imply that monolayer-thin oxide films have rather unique properties.
dc.description5 pages, 3 figures, accepted by PRL
dc.identifierhttps://arxiv.org/abs/0707.2031
dc.identifierhttp://arxiv.org/abs/0707.2031
dc.identifierPhys. Rev. Lett. 99, 086101 (2007)
dc.identifierdoi:10.1103/PhysRevLett.99.086101
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/136267
dc.subjectMaterials Science
dc.titleUltrathin oxides: bulk-oxide-like model surfaces or unique films?
dc.typetext

Files

Collections