A fast method for the measurement of long spin-lattice relaxation times by Single Scan Inversion Recovery experiment

dc.creatorBhattacharyya, Rangeet
dc.creatorKumar, Anil
dc.date2003-11-07
dc.date.accessioned2026-07-07T02:54:39Z
dc.date.available2026-07-07T02:54:39Z
dc.descriptionA new method of measuring long spin-lattice relaxation times ($T_1$) is proposed. Being a single scan technique, the method is at least one order of magnitude faster than the conventional technique. This method (Single-Scan or Slice Selected Inversion Recovery or SSIR) relies on the slice selection technique. The method is experimentally verified and compared with the time taken by the conventional measurement. Furthermore, it is shown that the conventional Inversion Recovery (IR) method which suffers from effects of r.f. inhomogeneity can also be improved by measuring the magnetization of only a central slice.
dc.description12 pages, 5 figures. Chemical Physics Letters, in press
dc.identifierhttps://arxiv.org/abs/cond-mat/0311154
dc.identifierhttp://arxiv.org/abs/cond-mat/0311154
dc.identifierdoi:10.1016/j.cplett.2003.10.133
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22635
dc.subjectSoft Condensed Matter
dc.subjectMaterials Science
dc.titleA fast method for the measurement of long spin-lattice relaxation times by Single Scan Inversion Recovery experiment
dc.typetext

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