Segmented Foil SEM Grids at Fermilab

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dc.creatorKopp, S.
dc.creatorIndurthy, D.
dc.creatorPavlovich, Z.
dc.creatorProga, M.
dc.creatorZwaska, R.
dc.creatorBaller, B.
dc.creatorChildress, S.
dc.creatorFord, R.
dc.creatorHarris, D.
dc.creatorKendziora, C.
dc.creatorMoore, C.
dc.creatorTassotto, G.
dc.date2005-06-27
dc.date.accessioned2026-07-07T11:28:24Z
dc.date.available2026-07-07T11:28:24Z
dc.descriptionWe present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5micrometers thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.
dc.descriptionpaper RPAT044 accepted to Proc. 2005 Particle Accelerator Conference
dc.identifierhttps://arxiv.org/abs/physics/0506194
dc.identifierhttp://arxiv.org/abs/physics/0506194
dc.identifierConf.Proc.C0505161:2821,2005
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/196432
dc.subjectInstrumentation and Detectors
dc.subjectHigh Energy Physics - Experiment
dc.subjectAccelerator Physics
dc.titleSegmented Foil SEM Grids at Fermilab
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