Low frequency current noise of the single-electron shuttle

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dc.creatorIsacsson, A.
dc.creatorNord, T.
dc.date2004-02-08
dc.date.accessioned2026-07-07T02:56:23Z
dc.date.available2026-07-07T02:56:23Z
dc.descriptionCoupling between electronic and mechanical degrees of freedom in a single electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low frequency current noise can be enhanced due to amplitude fluctuations of the shuttle oscillations. Moreover, at the onset of mechanical instability a pronounced peak in the low frequency noise is expected.
dc.description14 pages, 3 figures, 1 table
dc.identifierhttps://arxiv.org/abs/cond-mat/0402228
dc.identifierhttp://arxiv.org/abs/cond-mat/0402228
dc.identifierEurophys. Lett. 66, 708 (2004)
dc.identifierdoi:10.1209/epl/i2004-10024-x
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23299
dc.subjectMesoscale and Nanoscale Physics
dc.titleLow frequency current noise of the single-electron shuttle
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