Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements
| dc.creator | Sahin, Ozgur | |
| dc.date | 2007-09-04 | |
| dc.date.accessioned | 2026-07-07T10:57:18Z | |
| dc.date.available | 2026-07-07T10:57:18Z | |
| dc.description | Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force waveform with the use of non-linear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals. | |
| dc.description | 13 pages | |
| dc.identifier | https://arxiv.org/abs/0709.0533 | |
| dc.identifier | http://arxiv.org/abs/0709.0533 | |
| dc.identifier | Rev.Sci.Instrum.78:103707,2007 | |
| dc.identifier | doi:10.1063/1.2801009 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/186709 | |
| dc.subject | Instrumentation and Detectors | |
| dc.title | Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements | |
| dc.type | text |