Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

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dc.creatorBarends, R.
dc.creatorHortensius, H. L.
dc.creatorZijlstra, T.
dc.creatorBaselmans, J. J. A.
dc.creatorYates, S. J. C.
dc.creatorGao, J. R.
dc.creatorKlapwijk, T. M.
dc.date2008-04-22
dc.date2008-05-17
dc.date.accessioned2026-07-07T09:42:01Z
dc.date.available2026-07-07T09:42:01Z
dc.descriptionWe study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a non-monotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is independent of the SiOx thickness, demonstrating that the noise is not dominantly related to the low temperature resonance frequency deviations.
dc.description4 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/0804.3499
dc.identifierhttp://arxiv.org/abs/0804.3499
dc.identifierAppl. Phys. Lett. 92, 223502 (2008)
dc.identifierdoi:10.1063/1.2937837
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/162035
dc.subjectMesoscale and Nanoscale Physics
dc.subjectSuperconductivity
dc.titleContribution of dielectrics to frequency and noise of NbTiN superconducting resonators
dc.typetext

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