Domain structure sequence in ferroelectric Pb(Zr0.2Ti0.8)O3 thin film on MgO

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dc.creatorJanolin, Pierre-Eymeric
dc.creatorMarrec, Françoise Le
dc.creatorRinggaard, Erling
dc.creatorFraisse, Bernard
dc.creatorDkhil, Brahim
dc.date2007-03-23
dc.date.accessioned2026-07-07T07:53:23Z
dc.date.available2026-07-07T07:53:23Z
dc.descriptionThe structural evolution of a polydomain ferroelectric Pb(Zr0.2Ti0.8)O3 film was studied by temperature dependent X-ray diffraction. Two critical temperatures were evidenced: T*=740K, corresponding to a change in the domain structure (a/c/a/c to a1/a2/a1/a2), and Tc_film = 825K where the film undergoes a ferroelectricparaelectric phase transition. The films remains tetragonal on the whole range of temperature investigated. The evolutions of the domain structure and lattice parameters were found to be in very good agreement with the calculated domain stability map and theoretical temperature-misfit strain phase diagram respectively.
dc.descriptionTo be pubilshed in Appl. Phys. Lett
dc.identifierhttps://arxiv.org/abs/cond-mat/0703618
dc.identifierhttp://arxiv.org/abs/cond-mat/0703618
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/126233
dc.subjectMaterials Science
dc.titleDomain structure sequence in ferroelectric Pb(Zr0.2Ti0.8)O3 thin film on MgO
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