Single-loop interferometer for minimal ellipsometry

Simple item page
dc.creatorEnglert, Berthold-Georg
dc.creatorMing, Tin Kah
dc.creatorGuan, Goh Choon
dc.creatorKhoon, Ng Hui
dc.date2004-09-02
dc.date.accessioned2026-07-07T05:52:35Z
dc.date.available2026-07-07T05:52:35Z
dc.descriptionWe present a simple polarizing Mach-Zehnder interferometer that can be used for optimal minimal ellipsometry: Only four intensities are measured to determine the three Stokes parameters, and an optimal choice for the four polarization projections can be achieved for any sufficiently small wavelength range of interest.
dc.description8 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/physics/0409015
dc.identifierhttp://arxiv.org/abs/physics/0409015
dc.identifierLaser Physics 15 (2005) 7-9
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/86369
dc.subjectOptics
dc.titleSingle-loop interferometer for minimal ellipsometry
dc.typetext

Files

Collections

arXiv