Measurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films

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dc.creatorWu, Wenhao
dc.creatorBielejec, E.
dc.date2003-10-09
dc.date2005-11-02
dc.date.accessioned2026-07-07T06:34:47Z
dc.date.available2026-07-07T06:34:47Z
dc.descriptionBased on the Efros-Shklovskii behavior observed in electron transport and tunneling, we have determined, independently and up to a constant on the order of unity, the localization length and the dielectric constant for quench-condensed ultrathin amorphous beryllium films. As the normal-state sheet resistance of the films at 20 K is reduced with increasing film thickness, the localization length increases exponentially. The superconductor-insulator transition occurs when the localization length crosses the Ginzburg-Landau coherence length. We discuss the implication of these results on a number of issues regarding superconductivity in the strongly disordered regime.
dc.descriptionWithdrew the paper, resubmit a rewritten version
dc.identifierhttps://arxiv.org/abs/cond-mat/0310190
dc.identifierhttp://arxiv.org/abs/cond-mat/0310190
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/99633
dc.subjectSuperconductivity
dc.subjectStrongly Correlated Electrons
dc.titleMeasurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films
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