Nanomachining of mesoscopic graphite

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dc.creatorBarthold, P.
dc.creatorLuedtke, T.
dc.creatorHaug, R. J.
dc.date2008-03-17
dc.date.accessioned2026-07-07T09:27:10Z
dc.date.available2026-07-07T09:27:10Z
dc.descriptionAn atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed.
dc.identifierhttps://arxiv.org/abs/0803.2470
dc.identifierhttp://arxiv.org/abs/0803.2470
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/157001
dc.subjectMesoscale and Nanoscale Physics
dc.titleNanomachining of mesoscopic graphite
dc.typetext

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