Bayesian inference of nanoparticle-broadened x-ray line profiles

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dc.creatorArmstrong, N.
dc.creatorKalceff, W.
dc.creatorCline, J. P.
dc.creatorBonevich, J.
dc.date2003-05-06
dc.date.accessioned2026-07-07T05:49:08Z
dc.date.available2026-07-07T05:49:08Z
dc.descriptionA single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO$_{2}$ data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions. The comparison of the Bayesian/MaxEnt results from experimental CeO$_2$ with TEM results is favorable
dc.description43 pages, 13 Figures, 5 Tables
dc.identifierhttps://arxiv.org/abs/physics/0305018
dc.identifierhttp://arxiv.org/abs/physics/0305018
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/85288
dc.subjectData Analysis, Statistics and Probability
dc.titleBayesian inference of nanoparticle-broadened x-ray line profiles
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