Noise in refrigerating tunnel junctions and in microbolometers

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dc.creatorAnghel, D. V.
dc.creatorPekola, J. P.
dc.date2000-11-07
dc.date.accessioned2026-07-07T02:39:16Z
dc.date.available2026-07-07T02:39:16Z
dc.descriptionMicrorefrigerators based on normal metal-insulator-superconductor (NIS) junctions represent a very attractive alternative to cool the microbolometers and calorimeters for astrophysical observations in space-borne experiments. The performance in such measurements requires a good knowledge of the noise sources in the detectors. In this paper we present detailed calculations of the thermal fluctuations and of the noise equivalent power due to the heat transfer through the NIS junctions or due to the thermal contact between different subsystems of the detector. The influence of the background radiation will also be evaluated. Analytical approximations, valid at low temperatures, are given.
dc.description14 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0011111
dc.identifierhttp://arxiv.org/abs/cond-mat/0011111
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/16991
dc.subjectMesoscale and Nanoscale Physics
dc.titleNoise in refrigerating tunnel junctions and in microbolometers
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