Anti-Ferroelectric Thin Films Phase Diagrams

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dc.creatorEliseev, E. A.
dc.creatorGlinchuk, M. D.
dc.creatorMorozovska, A. N.
dc.date2006-08-30
dc.date.accessioned2026-07-07T07:19:53Z
dc.date.available2026-07-07T07:19:53Z
dc.descriptionIn the paper we consider size effects of phase transitions and polar properties of the thin antiferroelectric films. We modified phenomenological approach proposed by Kittel. The Euler-Lagrange equations were solved by direct variational method. The free energy with renormalized coefficients depending on the film thickness has been derived. The approximate analytical expression for the coefficients dependence on film thickness, temperature, polarization gradient coefficient and extrapolation lengths were obtained. We have shown how the anti-ferroelectric double hysteresis loop transforms into the ferroelectric single one under the film thickness decrease. Proposed theoretical consideration explains the experimental results obtained in antiferroelectric PbZrO_3 thin films.
dc.description15 pages, 5 figures, 2 appendices
dc.identifierhttps://arxiv.org/abs/cond-mat/0608684
dc.identifierhttp://arxiv.org/abs/cond-mat/0608684
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/114793
dc.subjectMaterials Science
dc.titleAnti-Ferroelectric Thin Films Phase Diagrams
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