Holographic analysis of diffraction structure factors

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dc.creatorMarchesini, S.
dc.creatorMannella, N.
dc.creatorFadley, C. S.
dc.creatorVan Hove, M. A.
dc.creatorBucher, J. J.
dc.creatorShuh, D. K.
dc.creatorFabris, L.
dc.creatorPress, M. H.
dc.creatorWest, M. W.
dc.creatorStolte, W. C.
dc.creatorHussain, Z.
dc.date2002-02-05
dc.date2002-05-02
dc.date.accessioned2026-07-07T02:44:20Z
dc.date.available2026-07-07T02:44:20Z
dc.descriptionWe combine the theory of inside-source/inside-detector x-ray fluorescence holography and Kossel lines/x ray standing waves in kinematic approximation to directly obtain the phases of the diffraction structure factors. The influence of Kossel lines and standing waves on holography is also discussed. We obtain partial phase determination from experimental data obtaining the sign of the real part of the structure factor for several reciprocal lattice vectors of a vanadium crystal.
dc.description4 pages, 3 figures, submitted
dc.identifierhttps://arxiv.org/abs/cond-mat/0202061
dc.identifierhttp://arxiv.org/abs/cond-mat/0202061
dc.identifierPhys. Rev. B 66, 094111 (2002)
dc.identifierdoi:10.1103/PhysRevB.66.094111
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/18878
dc.subjectCondensed Matter
dc.subjectOptics
dc.titleHolographic analysis of diffraction structure factors
dc.typetext

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