Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology

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dc.creatorWang, Xuefeng
dc.creatorChen, Yong P.
dc.creatorNolte, David D.
dc.date2008-11-07
dc.date.accessioned2026-07-07T12:20:11Z
dc.date.available2026-07-07T12:20:11Z
dc.descriptionWe apply spinning-disc picometrology to measure the complex refractive index of graphene on thermal oxide on silicon. The refractive index varies from n = 2.4-1.0i at 532 nm to n = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42i from 532 nm to 633 nm).
dc.identifierhttps://arxiv.org/abs/0811.1210
dc.identifierhttp://arxiv.org/abs/0811.1210
dc.identifierOptics Express Vol. 16, Iss. 26, pp. 22105 - 22112 (2008)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/213000
dc.subjectMaterials Science
dc.titleStrong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology
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