Logarithmic corrections in the two-dimensional Ising model in a random surface field

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dc.creatorPleimling, M.
dc.creatorBagamery, F. A.
dc.creatorTurban, L.
dc.creatorIgloi, F.
dc.date2004-02-06
dc.date2004-08-20
dc.date.accessioned2026-07-07T02:56:21Z
dc.date.available2026-07-07T02:56:21Z
dc.descriptionIn the two-dimensional Ising model weak random surface field is predicted to be a marginally irrelevant perturbation at the critical point. We study this question by extensive Monte Carlo simulations for various strength of disorder. The calculated effective (temperature or size dependent) critical exponents fit with the field-theoretical results and can be interpreted in terms of the predicted logarithmic corrections to the pure system's critical behaviour.
dc.description10 pages, 4 figures, extended version with one new section
dc.identifierhttps://arxiv.org/abs/cond-mat/0402188
dc.identifierhttp://arxiv.org/abs/cond-mat/0402188
dc.identifierJ. Phys. A 37 (2004) 8801
dc.identifierdoi:10.1088/0305-4470/37/37/003
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23288
dc.subjectStatistical Mechanics
dc.subjectDisordered Systems and Neural Networks
dc.titleLogarithmic corrections in the two-dimensional Ising model in a random surface field
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