On the Origin of the 2DEG Carrier Density at the LaAlO$_3$/SrTiO$_3$ Interface

dc.creatorPopović, Zoran S.
dc.creatorSatpathy, Sashi
dc.creatorMartin, Richard M.
dc.date2008-11-11
dc.date2008-12-09
dc.date.accessioned2026-07-07T12:09:58Z
dc.date.available2026-07-07T12:09:58Z
dc.descriptionTransport measurements of the two-dimensional electron gas (2DEG) at the LaAlO$_3$/SrTiO$_3$ interface have found a density of carriers much lower than expected from the "polar catastrophe" arguments. From a detail density-functional study, we suggest how this discrepancy may be reconciled. We find that electrons occupy multiple subbands at the interface leading to a rich array of transport properties. Some electrons are confined to a single interfacial layer and susceptible to localization, while others with small masses and extended over several layers are expected to contribute to transport.
dc.description4 pages, 7 figures, Accepted in Phys. Rev. Lett
dc.identifierhttps://arxiv.org/abs/0811.1624
dc.identifierhttp://arxiv.org/abs/0811.1624
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/209807
dc.subjectMaterials Science
dc.titleOn the Origin of the 2DEG Carrier Density at the LaAlO$_3$/SrTiO$_3$ Interface
dc.typetext

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