Electric field induced narrowing of exciton line width

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dc.creatorPonomarev, I. V.
dc.creatorDeych, L. I.
dc.creatorLisyansky, A. A.
dc.date2004-08-12
dc.date2005-10-27
dc.date.accessioned2026-07-07T06:37:14Z
dc.date.available2026-07-07T06:37:14Z
dc.descriptionConsidering effects of electric field on the low temperature absorption line of quantum well excitons, we show that, for moderate strength of the electric field, the main contribution to the field dependence of the line-width results from field induced modifications of inhomogeneous broadening of excitons. We find that the strength of the random potential acting on quantum well excitons due to alloy disorder and interface roughness can either decrease or increase with field depending upon the thickness of the well. This means that under certain conditions one can observe counterintuitive narrowing of exciton spectral lines in electric field.
dc.descriptionRevTeX4, 4 pages, 1 figure; submitted to Phys. Rev. Lett
dc.identifierhttps://arxiv.org/abs/cond-mat/0408296
dc.identifierhttp://arxiv.org/abs/cond-mat/0408296
dc.identifierPhys. Rev. B 72, 115304 (2005)
dc.identifierdoi:10.1103/PhysRevB.72.115304
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/100323
dc.subjectDisordered Systems and Neural Networks
dc.subjectMaterials Science
dc.titleElectric field induced narrowing of exciton line width
dc.typetext

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