Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction

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dc.creatorElmer, Franz-Josef
dc.date1997-12-11
dc.date.accessioned2026-07-07T03:09:37Z
dc.date.available2026-07-07T03:09:37Z
dc.descriptionWe propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the tip-surface interaction potential can be measured simultaneously. Because of its threshold behavior parametric resonance AFM leads to sharp contrasts in surface imaging.
dc.descriptionWritten in REVTeX, 4 pages, 4 Postscript figures
dc.identifierhttps://arxiv.org/abs/cond-mat/9712120
dc.identifierhttp://arxiv.org/abs/cond-mat/9712120
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/27955
dc.subjectMaterials Science
dc.titleParametric resonance in atomic force microscopy: A new method to study the tip-surface interaction
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