Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains

dc.creatorBentrem, Frank W.
dc.creatorPandey, R. B.
dc.creatorFamily, Fereydoon
dc.date2006-07-03
dc.date.accessioned2026-07-07T07:15:49Z
dc.date.available2026-07-07T07:15:49Z
dc.descriptionGrowth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer simulations in (2+1) dimensions. The evolution of the interface width W shows a crossover from short-time growth described by the exponent beta1 to a long-time growth with exponent beta2 (>beta1). The saturated width increases, i.e., the interface roughens, with the molecular weight Lc, but the roughness exponent alpha (from Ws~L^alpha) becomes negative in contrast to models for particle deposition; alpha depends on the chain length--a nonuniversal scaling with the substrate length L. Roughening and deroughening occur as the field E and the temperature T compete such that Ws=(A+BT)E^-1/2.
dc.description5 pages, 5 figures, RevTex
dc.identifierhttps://arxiv.org/abs/cond-mat/0607062
dc.identifierhttp://arxiv.org/abs/cond-mat/0607062
dc.identifierPhys. Rev. E 62, 914--917 (2000)
dc.identifierdoi:10.1103/PhysRevE.62.914
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/113357
dc.subjectSoft Condensed Matter
dc.subjectMaterials Science
dc.titleRoughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains
dc.typetext

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