Low frequency conductance fluctuations (1/f^αnoise) in 15nm Ag nanowires: Implication on its stability

dc.creatorBid, Aveek
dc.creatorBora, Achyut
dc.creatorRaychaudhuri, A. K.
dc.creatorChakravortya, D.
dc.date2004-11-05
dc.date2005-12-06
dc.date.accessioned2026-07-07T06:37:21Z
dc.date.available2026-07-07T06:37:21Z
dc.descriptionWe have measured the low frequency (1mHz<f<10Hz) resistance fluctuations in metallic nanowires (diameter 15nm to 200nm) in the temperature range 77K to 400K. The nanowires were grown electrochemically in polycarbonate membranes and the measurements were carried out in arrays of nanowires by retaining them in the membrane. A large fluctuation in excess of conventional 1/f noise which peaks beyond a certain temperature was found. The fluctuations with a significant low frequency component (~1/f^{3/2}) arise when the diameter of the wire ~15nm and vanishes rapidly as the diameter is increased. We argue that Rayleigh-Plateau instability is the likely cause of this excess noise.
dc.description5 pages, 5 figures. Published in Physical Review B
dc.identifierhttps://arxiv.org/abs/cond-mat/0411143
dc.identifierhttp://arxiv.org/abs/cond-mat/0411143
dc.identifierPhysical Review B, 72, 113415 (2005)
dc.identifierdoi:10.1103/PhysRevB.72.113415
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/100360
dc.subjectMesoscale and Nanoscale Physics
dc.subjectStatistical Mechanics
dc.titleLow frequency conductance fluctuations (1/f^αnoise) in 15nm Ag nanowires: Implication on its stability
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