Qubit decoherence due to detector switching

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dc.creatorSerban, I.
dc.creatorWilhelm, F. K.
dc.date2009-05-19
dc.date.accessioned2026-07-07T13:16:26Z
dc.date.available2026-07-07T13:16:26Z
dc.descriptionWe provide insight into the qubit measurement process involving a switching type of detector. We study the switching-induced decoherence during escape events. We present a simple method to obtain analytical results for the qubit dephasing and bit-flip errors, which can be easily adapted to various systems. Within this frame we investigate potential of switching detectors for a fast but only weakly invasive type of detection. We show that the mechanism that leads to strong dephasing, and thus fast measurement, inverts potential bit flip errors due to an intrinsic approximate time reversal symmetry.
dc.description5 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/0905.3045
dc.identifierhttp://arxiv.org/abs/0905.3045
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/230790
dc.subjectMesoscale and Nanoscale Physics
dc.subjectSuperconductivity
dc.titleQubit decoherence due to detector switching
dc.typetext

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