GaAs Microstrip Testbeam Results
| dc.creator | Gowdy, S. | |
| dc.date | 1995-09-14 | |
| dc.date.accessioned | 2026-07-07T03:37:10Z | |
| dc.date.available | 2026-07-07T03:37:10Z | |
| dc.description | A gallium arsenide detector was tested with a beam of 70GeV pions at the {\sf SPS} at CERN. The detector utilises a novel biasing scheme which has been shown to behave as expected. The detector has a pitch of 50$μ$m and therefore an expected resolution of 14.5$μ$m. The measured resolution was approximately 14$μ$m. By using a non-linear charge division algorithm this can be increased to $\approx$ 12$μ$m. Noise was the limiting factor to the resolution. This was 2000e$^-$ as opposed to the expected 360e$^-$. This noise is also thought to have reduced the detection efficiency of the detector. The source of the excess noise is currently being investigated. | |
| dc.description | 10 pages. 16 postscript figures + 1 postscript preprint logo + 1 LaTeX file + 2 non-standard style files. Uses epsfig. Files tarred, gzipped and uuencoded into 1 file. Also available at http://ppewww.ph.gla.ac.uk/preprints/95/04 | |
| dc.identifier | https://arxiv.org/abs/hep-ex/9509008 | |
| dc.identifier | http://arxiv.org/abs/hep-ex/9509008 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/38005 | |
| dc.subject | High Energy Physics - Experiment | |
| dc.title | GaAs Microstrip Testbeam Results | |
| dc.type | text |