Low intensity threshold values for keV X-ray production in laser-cluster interaction

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dc.creatorPrigent, C.
dc.creatorAdoui, L.
dc.creatorLamour, E.
dc.creatorRozet, J. -P.
dc.creatorVernhet, D.
dc.creatorGobert, O.
dc.creatorMeynadier, P.
dc.creatorNormand, D.
dc.creatorPerdrix, M.
dc.date2005-07-06
dc.date.accessioned2026-07-07T05:55:19Z
dc.date.available2026-07-07T05:55:19Z
dc.descriptionAbsolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A clear threshold behavior is observed. The intensity threshold is found as low as 2 1014 Wcm-2, a value matching the production of singly-charged argon or doubly-charged xenon by optical field ionization. Possible mechanisms involved in the inner-shell ionization are discussed. The outcome on the optimization of keV X-ray production is underlined.
dc.description1 table, 4 figures. submitted to Physical Review Letters
dc.identifierhttps://arxiv.org/abs/physics/0507042
dc.identifierhttp://arxiv.org/abs/physics/0507042
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/87241
dc.subjectAtomic and Molecular Clusters
dc.subjectAtomic Physics
dc.titleLow intensity threshold values for keV X-ray production in laser-cluster interaction
dc.typetext

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