MBE Growth of Cubic InN

dc.creatorSchoermann, J.
dc.creatorAs, D. J.
dc.creatorLischka, K.
dc.date2007-02-06
dc.date.accessioned2026-07-07T07:44:59Z
dc.date.available2026-07-07T07:44:59Z
dc.descriptionCubic InN films were grown on top of a c-GaN buffer layer by rf-plasma assisted MBE at different growth temperatures. X-Ray diffraction investigations show that the c-InN layers consist of a nearly phase-pure zinc blende (cubic) structure with a small fraction of the wurtzite (hexagonal) phase grown on the (111) facets of the cubic layer. The content of hexagonal inclusions is decreasing with decreasing growth temperature. The full-width at half-maximum (FWHM) of c-InN (002) rocking curve is about 50 arcmin. Low temperature photoluminescence measurements reveal a band gap of about 0.61eV for cubic InN.
dc.description3 pages with 3 figures; MRS Symposium, Fall Meeting 2006
dc.identifierhttps://arxiv.org/abs/cond-mat/0702140
dc.identifierhttp://arxiv.org/abs/cond-mat/0702140
dc.identifierMRS Symp. Proc. Vol. 955E, I8.3 (2007)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/123393
dc.subjectMaterials Science
dc.titleMBE Growth of Cubic InN
dc.typetext

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