Influence of fractional composition of crystallite grains on the dark conductivity in fully crystallized undoped microcrystalline silicon

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dc.creatorRam, Sanjay K.
dc.creatorKumar, Satyendra
dc.creatorCabarrocas, P. Roca i
dc.date2007-02-16
dc.date.accessioned2026-07-07T07:47:16Z
dc.date.available2026-07-07T07:47:16Z
dc.descriptionImprovement in film growth technology requires a knowledge of the correlation between microstructural and deposition parameters with electrical properties in hydrogenated microcrystalline Si films. Our study indicates that fractional compositions of the constituent crystallite grains in fully crystallized undoped microcrystalline Si films is a unique microstructural feature that defines the film microstructure and can be well correlated to the electrical transport properties as well.
dc.description4 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0702385
dc.identifierhttp://arxiv.org/abs/cond-mat/0702385
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/124109
dc.subjectMaterials Science
dc.titleInfluence of fractional composition of crystallite grains on the dark conductivity in fully crystallized undoped microcrystalline silicon
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